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Every second counts for process and quality control. Test results are urgently needed from the moment the sample is received. XRF2501 is equipped with a simple and intuitive interface that allows you to load samples, touch the button, and get high-quality results in seconds.
Compared with AAS,AFS,ICP and ICP-MS analysis technology, there is no need for XRF2501 to dissolve and digest samples, or use chemical reagent. The analysis speed of it is rapid without destroying samples. XRF2501 can be used to analyze samples, whether solid or liquid, pressed or powder, large or small.
Wide Applicability: Suitable for solid, liquid, powder and particle samples.
|Model||XRF2501 EDXRF Spectrometer|
|Elements||All elements from Na-U|
|Application Scope||Phosphorus in coal and coal ash composition analysis (Na2O, MgO, Al2O3, SiO2, P2O5,SO3, K2O, CaO,Fe2O3, etc.);Cement, RoHS, geological mining, plastic polymer, petrochemical, metal, environmental protection, medicine, archaeological art, food and cosmetics.|
|Sample types||Powder, Particle, Solution, Sol, Solid, etc.|
|Sample Rotation||Increase the test area by rotating the sample to improve the repeatability and accuracy|
|X-Ray Tube|| Optional target materials
Max Power: 50W
Max Voltage: 50KV
|Detectors||Silicon Drift Detector
Energy Resolution: 127eV FWHM @ Mn Kα
Count Rate: 1000000cps
|He Scour System||The built-in helium scour system improves the testing performance of powder samples.|
|Pollution Protection System||Integrated detector and x-ray tube protection system to avoid liquid sample leakage, solid sample falling particles and damage to detector and x-ray tube by dust.|
|Vacuum System||Tablet sample is measured in vacuum mode and does not consume any helium.|
|Radiation Safety||Conform to GBZ115—2002 Radiological protection standards for X-ray diffraction and fluorescence analysis equipment|