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  • 5E-XRF2510 EDXRF Spectrometer
  • 5E-XRF2510 EDXRF Spectrometer

5E-XRF2510 EDXRF Spectrometer NEW!

5E-XRF2510 EDXRF Spectrometer adopts energy dispersive X-ray fluorescence spectrum (EDXRF), which is a qualitative and quantitative analysis technique for rapid and nondestructive determination of major and minor elements in various types of samples (solid, powder, liquid).

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  • Features
  • Specifications
  • Spare parts
  • Case

Wide Applicability: Suitable for solid, liquid, powder and particle samples.

Easy Operation: 
There is no need for complicated sample preprocessing. Users only need to put samples into the test area and click Start to complete the analysis. 

High Efficiency:
1-15min for single sample analysis (which can be adjusted as required). With Robot manipulator, XRF2510 can load 60 samples per batch automatically, which can greatly improve the test efficiency.

Modular Design:
Free combination as needed fits a variety of usage scenarios. 

Low Cost:
No chemical and other consumables are needed, and no helium is consumed in vacuum mode.

Best Resolution and CR:
Adopt advanced silicon drift detector with the best count rate and energy resolution. Make full use of the output of 50W power optical tube, ensuring high stability and sensitivity.

Wide Range:
All elements from Na-U are tested at concentrations ranging from PPM to 100%.

Safe Operation:
The test chamber of the instrument adopts triple protection measures including thick copper, electronic interlock design and software interrupt, absolutely ensuring no X-ray leakage in any test environment.

Touch Screen Control:
Ergonomic touch screen design allows operators to get rid of the keyboard and mouse constraints. Software design is simple and intuitive. Anyone can use touch screen control software to operate the instrument, making the whole analysis easier and faster.


5E-XRF2510 EDXRF Spectrometer
Elements All elements from Na-U
Concentration Range ppm-100%
Application Scope Phosphorus in coal and coal ash composition analysis (Na2O, MgO, Al2O3, SiO2, P2O5,SO3, K2O, CaO,Fe2O3, etc.);Cement, RoHS, geological mining, plastic polymer, petrochemical, metal, environmental protection, medicine, archaeological art, food and cosmetics.
Sample types Powder, Particle, Solution, Sol, Solid, etc.
Spectral Chamber Size 110(Diameter)×125(Height) mm
Atmosphere Mode Air Mode  Suitable for heavy element analysis in all types of samples
Helium System Provide best performance for light element analysis in volatile liquid samples such as fuels
Vacuum SystemTablet sample is measured in vacuum mode and does not consume any helium.
X-Ray Tube Optional target materials
Max Power: 50W
Max Voltage: 50KV
Max Current:1mA
Detectors Silicon Drift Detector
Energy Resolution: 127eV FWHM @ Mn Kα
Count Rate: 100000cps
Peltier Cooling
He Scour System The built-in helium scour system improves the testing performance of powder samples.
Pollution Protection System Integrated detector and x-ray tube protection system to avoid liquid sample leakage, solid sample falling particles and damage to detector and x-ray tube by dust.
Vacuum System Tablet sample is measured in vacuum mode and does not consume any helium.
Radiation Safety Conform to GBZ115—2002 Radiological protection standards for X-ray diffraction and fluorescence analysis equipment
Dimensions(L×W×H) 760×680×880mm